Process Mapping Using the Integrated Definition Language for Functional Modeling (IDEF-0)
Joe Crance, CSSBB and CQE
Abstract: While there have been a plethora of articles and presentations on process mapping, a particularly insightful process mapping approach is Integrated Definition Language for Functional Modeling (IDEF-0). Whereas traditional flow charts can become confusing when mapping a complex process, and traditional value streams may be too high to assist in methods engineering, the IDEF methodology allows a robust systems view that can drill down to the user’s need. The presentation will cover:
- A History of IDEF
- How IDEF Captures a System’s View. . .Better
- Principles of Process Mapping With IDEF
- Benefits of Using IDEF
- Case Study Example
Speaker Bio: Joseph Crance, MBA, is a retired US Air Force officer, consultant to the U.S. Army, and management analyst for the Air Force–serving the Department of Defense for nearly 30 years. Joe had led, conducted, or consulted on over 70 manpower studies for the U.S. Air Force–measuring everything from medical to service to industrial functions. He also co-authored articles on activity-based costing and work measurement for the Institute of Industrial Engineers’ monthly publications and taught work measurement and quality control at the undergraduate level for his alma mater, Southern Illinois University (Carbondale). Joe holds certifications as a Six Sigma Black Belt and Quality Engineer through ASQ.
Please join us Thursday, September 21, 2017 at Tags, 3037 State Route 352, Big Flats, NY
Registration: 5:30 – 6:00 p.m.
Dinner: 6:00 – 7:00 p.m.
Speaker: 7:00 p.m.
Cost: $25.00 for members and for non-members
All forms of payment accepted – cash, check and credit cards.
Make checks payable to ASQ Section 0202. All major credit cards accepted.
Reservations: Please contact via e-mail at email@example.com no later than Tuesday, September 19, 2017 at 12:00pm
Cancellations later than 72 hours prior to this event will be invoiced
** Non-members are welcome and encouraged to attend **